Showing 1-25 of 9,504 resultsfor "Index Terms":Acceleration Voltage
"Index Terms":Acceleration Voltage
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Voltage compensation based calibration measurement of 3D-acceleration transducer in fall detection system for the elderly
Li Zheng;Lu Wang;Dianning He;Ning Geng;Ping Geng;Dejun Guan;Lisheng Xu
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society
Year: 2014 | Conference Paper |
The fall detection algorithm, which can recognize the fall of human body by collecting the acceleration signals in different directions of the body, is an important part of fall detection system for the elderly. The system, however, may have errors during analyzing the acceleration signal, due to that the coordinate system of the transducer does not coincide with the one of human motion. Furthermo...Show More
Electron beam lithography using inorganic resist at low acceleration voltage
Y. Ishii;J. Taniguchi;K. Ishikawa;Y. Sakamoto;I. Sato;I. Miyamoto
Digest of Papers Microprocesses and Nanotechnology 2005
Year: 2005 | Conference Paper |
In this paper, EBL at low acceleration voltage is possible to control of developed depth (3D patterning) and rapid fabrication process around 100 nm line widths. Furthermore, inorganic resist is effective for fine patterning, and this material is eco-friendly. The combination of these techniques realizes time-saving, low electrical consumption and eco-friendly process and powerful tool for mask pa...Show More
A method for rapid screening of various low-k TDDB models
Fen Chen;Carole Graas;Michael Shinosky;Chad Burke;Kai D Feng;Craig Bocash;Ramachandran Muralidhar
2015 IEEE International Reliability Physics Symposium
Year: 2015 | Conference Paper |
Cited by: Papers (3)
Voltage or Field acceleration model is crucial for low-k TDDB reliability study and lifetime projection. Over the years, many different acceleration models have been proposed based on different physics. In this paper, a method for a relatively fast screen of various low-k TDDB models is proposed. Fast voltage ramp test to establish a relation of JE slope versus stress field is the first step. Stud...Show More
On Voltage Acceleration Models of Time to Breakdown—Part I: Experimental and Analysis Methodologies
We propose and outline three independent experimental methodologies applicable to the investigation of voltage acceleration models of time to breakdown (T BD) for dielectric breakdown. The self-consistence requirement of voltage acceleration models and Poisson random statistics in terms of area scaling is discussed in detail. Three different T BD acceleration models, which are T BD exponential law...Show More
Rapid Prediction of RRAM RESET-State Disturb by Ramped Voltage Stress
Wun-Cheng Luo;Kuan-Liang Lin;Jiun-Jia Huang;Chung-Lun Lee;Tuo-Hung Hou
This letter proposes a novel technique for predicting with high confidence the disturbance of the resistive-switching random access memory (RRAM) RESET state based on ramped voltage stress. The technique yields statistical distributions and voltage acceleration parameters equivalent to those of a conventional constant voltage method. Several ramp rates and acceleration models were validated for th...Show More
Comparison of streamer propagation in mineral oils under lightning and step impulse voltages
2014 IEEE 18th International Conference on Dielectric Liquids (ICDL)
Year: 2014 | Conference Paper |
Cited by: Papers (4)
Both step impulse and lightning impulse voltages were widely used to study streamer in liquid phenomena. This paper investigates the effects of voltage waveforms including step impulse (0.4/1400 μs) and lightning impulse (1.2/50 μs) on streamer propagation and breakdown under both positive and negative polarities. The results indicate that lightning impulse quenches the streamer propagation and le...Show More
Product failures: Power-law or exponential voltage dependence?
Amr Haggag;Keith Forbes;Gary Anderson;Dave Burnett;Peter Abramowitz;Mohamed Moosa
2010 IEEE International Reliability Physics Symposium
Year: 2010 | Conference Paper |
Cited by: Papers (3)
The product failures voltage acceleration has traditionally been modelled with exponential voltage dependence. However with voltage scaling, the voltage acceleration parameter (VAP) in an exponential model has increased as V−1 - as expected for dielectric breakdown in either back-end or front-end. This suggests an exponential model is probably quite conservative and a power-law model may be more a...Show More
Radial Disturbance Effective on the Output Voltage Sensitivity of Piezoelectric Vibration Acceleration Sensor
2008 IEEE International Conference on Networking, Sensing and Control
Year: 2008 | Conference Paper |
Cited by: Papers (1)
The prototype of piezoelectric vibration acceleration sensor was fabricated which sensitive element consists of piezoelectric ceramic disk sandwiched with truncated conical metal end caps. The acceleration forces on the sensor were analyzed, the output voltage sensitivity, SU, of the sensor as a function of the acceleration force, F, was studied and the mathematics model was established. Radial di...Show More
On Voltage Acceleration Models of Time to Breakdown—Part II: Experimental Results and Voltage Dependence of Weibull Slope in the FN Regime
Based on the methodologies and experimental findings presented in Part I, we demonstrate the general applicability of the T BD exponential law of reciprocal voltage, T BD ~ exp(C/VG), in comparison with the T BD power-law model for SiO2-based dielectrics stressed in the FN regime. This is done for a wide range of oxide thicknesses and stressed in a wide range of stress voltages and temperatures. W...Show More
Voltage based protection for10kV distribution network with photovoltaic integration
2016 IEEE PES Asia-Pacific Power and Energy Engineering Conference (APPEEC)
Year: 2016 | Conference Paper |
Cited by: Papers (1)
Due to the fact that fault characteristics of the distribution network with photovoltaic (PV) integration are quite different from those in the traditional distribution network, conventional overcurrent protections have encountered new challenges. In this paper, a novel inverse-time undervoltage protection principle is proposed, which uses voltage drop to detect the fault and current to determine ...Show More
Fast TDDB monitoring for BEOL interconnect dielectrics
2017 IEEE International Integrated Reliability Workshop (IIRW)
Year: 2017 | Conference Paper |
Cited by: Papers (3)
In this paper, we present a simple experimental setup to expand our fast TDDB methodology [1] into a broad voltage range covering FEOL and BEOL TDDB testing. The new setup uses a combination of standard (SMU) and fast measurement unit (FMU) in differential mode to expand the stress voltage range while collecting failure times in tens of microseconds. The new apparatus was used to perform TDDB on a...Show More
A Prevenient Voltage Stress Test Method for High Density Memory
Jongsoo Yim;Gunbae Kim;Incheol Nam;Sangki Son;Jonghyoung Lim;Hwacheol Lee;Sangseok Kang;Byungheon Kwak;Jinseok Lee;Sungho Kang
4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008)
Year: 2008 | Conference Paper |
Cited by: Patents (1)
The most effective acceleration factor of reliability is the high voltage stress. However high electric field generated on thin gate oxide transistors in nanometer technology becomes the uppermost limit. In this paper, an improved voltage stress method for DRAM with the 6F2 structure and the open bit line scheme is proposed to enhance the Early Life Failure Rates (ELFR) and the yield of package te...Show More
Activities related to motor-starting studies, including design considerations for new systems, analytical studies for existing systems, as well as operational and model-validation considerations for industrial and commercial power systems are described. Motor-starting analysis includes evaluation of motor-starting current and voltage drop. Accuracy of calculation results primarily relies on system...Show More
Study on the propagation characteristic of streamer in long oil gap of natural ester
Jinghan Zhou;Jian Li;Jianfeng He;Gaolin Wu;Qian Wang;Yong Li;Yongfu Li;Huadong Peng
2018 12th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)
Year: 2018 | Conference Paper |
Cited by: Papers (6)
As a new kind of environmentally friendly liquid dielectric, the natural ester has excellent physicochemical properties, together with high fire point and low toxicity. So it is regarded as suitable insulating material for transformer. There already existed a large amount of distribution transformers using natural ester in service in the world, while the use of natural ester in power transformer i...Show More
Temperature and field interrelation study of low-k TDDB for Cu interconnects with and without liner - New insights to the roles of Cu for a competing breakdown process
Fen Chen;Michael Shinosky;John Aitken;Chih-Chao Yang;Daniel Edelstein
2013 IEEE International Reliability Physics Symposium (IRPS)
Year: 2013 | Conference Paper |
Low-k time dependent dielectric breakdown (TDDB) is commonly considered an important reliability issue. It has been proposed that there is an interrelation of field and temperature dependence between TDDB thermal activation energies and field acceleration parameters, which could provide a more comprehensive picture to understand low-k TDDB breakdown mechanism. In this study, an extensive investiga...Show More
A study of scaling effects on DRAM reliability
2011 Proceedings - Annual Reliability and Maintainability Symposium
Year: 2011 | Conference Paper |
Cited by: Papers (13)
In this study, commercial 512 Mb Double Data Rate Synchronous Dynamic Random Access Memory (DDR SDRAM) modules from three progressive technologies - 130 nm, 110 nm and 90 nm - were selected for experimentation to investigate degradation trends as a function of scaling. High temperature, high voltage accelerated stress testing was performed to characterize DRAM reliability and failure rates. Retent...Show More
Time to breakdown studies for liquids of different physico-chemical nature
2017 IEEE 19th International Conference on Dielectric Liquids (ICDL)
Year: 2017 | Conference Paper |
Cited by: Papers (3)
An automated setup for testing dielectric performance of liquids in a small point-to-plane gap is presented. It provides step voltages with rise times around 30 ns, with amplitudes up to 90 kV. Breakdown studies of thirteen different liquids were conducted with a gap distance of 4 mm in a test cell containing 20 ml liquid. The liquids were circulated and filtered after each breakdown to remove car...Show More
Voltage Acceleration of TBD and Its Correlation to Post Breakdown Conductivity of N- and P-Channel MOSFETs
2006 IEEE International Reliability Physics Symposium Proceedings
Year: 2006 | Conference Paper |
The gate oxide breakdown behavior of advanced n- and p-channel CMOS devices was thoroughly investigated from the time range of electrical overstress events (mus) to package level test conditions (106 s). The voltage acceleration follows the power-law-model over 12 decades in time. In addition the current-voltage driven wear out was studied for linear and non-linear driver elements. It was found th...Show More
Voltage acceleration and pulse dependence of barrier breakdown in MgO based magnetic tunnel junctions
S. Van Beek;K. Martens;P. Roussel;G. Donadio;J. Swerts;S. Mertens;A. Thean;G. Kar;A. Furnemont;G. Groeseneken
2016 IEEE International Reliability Physics Symposium (IRPS)
Year: 2016 | Conference Paper |
Cited by: Papers (6)
STT-MRAM is a promising non-volatile memory. For reliable lifetime predictions, a correct voltage acceleration model is essential. However, there is no consensus over what acceleration model to use. In this paper we study barrier breakdown time over an extended time range. With a maximum likelihood ratio method, we test the statistical significance of fits for different voltage acceleration models...Show More
Control Strategy for the Acceleration Voltage of the ITER Neutral Beam Injector
The acceleration grid power supply of the ITER neutral beam injector is designed to deliver up to 200 kV to each of the five stages of the electrostatic accelerator, producing a total voltage up to -1 MV with respect to ground. In the present design, the output voltages of the dc generators are independently controlled by five closed control loops. The output voltage measurements are obtained from...Show More
Soft-Starter for High-Voltage IM Based on a Multi-Zone AC Voltage Regulator with Improved EMC
2020 1st International Conference Problems of Informatics, Electronics, and Radio Engineering (PIERE)
Year: 2020 | Conference Paper |
Cited by: Papers (3)
The simplicity and reliability of the operation of an induction motor (IM) play a fundamental role in wide practical application in production and in household appliances. A direct connection of a high-voltage motor to the network is characterized by a large inrush current and entails overheating, excessive wear of the motor windings and deep voltage dips in the network. In this article, we propos...Show More
Investigating the Positive Lightning Impulse Breakdown Voltage and Acceleration Voltage of Selected GTL Based Dielectric Liquids
2024 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)
Year: 2024 | Conference Paper |
This paper presents a comparison of the lightning properties of three insulating fluids. Conventional inhibited mineral oil (IMO) was compared with two inhibited liquids made using Gas-to-Liquids technology (GTL), which were marked as GTL-I and GTL-I-GA. The focus was on two parameters: lightning impulse breakdown voltage (LIBV) and acceleration voltage $\left(\mathrm{V}_{\mathrm{a}}\right)$. Test...Show More
Target steering and electrostatic acceleration for IFE
R. W. Petzoldt;D.T. Goodin;E. Valmianski;L.C. Carlson;J.D. Stromsoe;J. Hares
2009 23rd IEEE/NPSS Symposium on Fusion Engineering
Year: 2009 | Conference Paper |
We have demonstrated that in-flight electrostatic steering can substantially improve target placement accuracy. We optically track the motion of a charged target and feed back appropriate steering voltage to four steering electrodes. Target placement accuracy of falling ~1.8 mg shells with 0.5 m stand off from steering electrodes is improved from ~ 500 to 10 ¿m standard deviation in each transvers...Show More
Transformation of Ramped Current Stress VBDto Constant Voltage Stress TDDB TBD
2019 IEEE International Reliability Physics Symposium (IRPS)
Year: 2019 | Conference Paper |
Cited by: Papers (5)
We have carried out an investigation for equivalence among three different stress methods: ramped voltage stress (RVS) method, ramped current stress (RCS) method, and constant voltage stress (CVS) method. Unlike the conventional RVS test with a constant ramp rate, we show the change of response voltage in RCS tests can be regarded as effectively a variable ramp rate. A data-analysis methodology al...Show More
A Realistic Method for Time-Dependent Dielectric Breakdown Reliability Analysis for Advanced Technology Node
Kong Boon Yeap;Fen Chen;Huade Walter Yao;Tian Shen;Sing Fui Yap;Patrick Justison
This paper proposes a methodology to determine a realistic time-dependent dielectric breakdown failure rate. The in-die constant voltage stress was performed to determine the chip level Weibull shape (βdie) and voltage acceleration factor, while a voltage ramp (Vramp) is performed in production line (inline Vramp) to determine the via-to-line and line-to-line spacing distributions. We found that f...Show More
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