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Solid and Non-Solid Dielectric Material Characterization for Millimeter and Sub-Millimeter Wave Applications | IEEE Conference Publication | IEEE Xplore

Solid and Non-Solid Dielectric Material Characterization for Millimeter and Sub-Millimeter Wave Applications


Abstract:

An accurate quasi-optical S-parameter measurement method implemented in the normalized frequency bands Ka, W and J is presented in this paper. Permittivity extraction of ...Show More

Abstract:

An accurate quasi-optical S-parameter measurement method implemented in the normalized frequency bands Ka, W and J is presented in this paper. Permittivity extraction of various solid or non-solid dielectric materials is performed using the 4 S-parameters without time domain gating nor filtering. The procedure is validated through the comparison between the simulated and measured 4 S-parameters in magnitude and phase. Results are given for the Rexolite over a wide frequency span from the Ka to J band while some non-solid materials were characterized in the W band. Moreover, effects of rain flow on a dielectric slab were investigated for automotive radar applications in the W band and preliminary results are given.
Date of Conference: 12-14 January 2021
Date Added to IEEE Xplore: 02 February 2021
ISBN Information:
Conference Location: Utrecht, Netherlands

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