I. Introduction
Spectrophotometry and infrared spectroscopy often serve as the tools of choice for material analysis by their ease of use to acquire spectral data. The data can be presented in the form of either sample absorbance log(1/ or attenuation coefficient , where is wavelength, the measured signal of collimated transmittance, and the sample thickness along the direction of incident light beam. Conventional instrument designs for determination of or are founded on the assumption that light attenuation is dominated by atomic and/or molecular absorption [1]–[3]. The assumption, however, breaks down if light scattering is no longer negligible. One must then consider the effect of scattering on measured signals and solve the challenging problems of forward modeling of light scattering and inverse parameter extraction. In return, multiple sample parameters with wavelength dependence enhance markedly the ability to characterize materials by quantification of molecular composition through absorption parameter and wavelength-scaled structures through scattering parameters. Over the past decades, numerous light scattering models of different approximations have been developed and combined with efficient inverse algorithms to retrieve sample parameters from measured signals [4]–[6]. Various spectrophotometric system designs incorporated these methods to determine absorption and scattering parameters in academic laboratory settings. Nearly all designs require integrating spheres for hemispherically integrated measurement of signals and fast parameter extraction from the signals [2], [7]–[13].