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Band Structure of Strained - Alloy: A Full-Zone 30-Band - Model | IEEE Journals & Magazine | IEEE Xplore

Band Structure of Strained \mathrm{Ge}_{1-x}~\mathrm{Sn}_{x} Alloy: A Full-Zone 30-Band {k}\cdot{p} Model


Impact Statement:We extend our previous 30-band k·p model to compute electronic band structure of strained Ge1?xSnx alloy at room temperature. Based on it, we carefully investigate the ba...Show More

Abstract:

We extend the previous 30-band k.p model effectively employed for relaxed Ge1-xSnx alloy to the case of strained Ge1-xSnx alloy. The strain-relevant parameters for the 30...Show More
Impact Statement:
We extend our previous 30-band k·p model to compute electronic band structure of strained Ge1?xSnx alloy at room temperature. Based on it, we carefully investigate the bandgap dependence of Ge1-xSnx alloy under uniaxial and biaxial strain along [100] [110] and [111] directions. Besides, the good agreement between our predictions and published results about the bandgap variation at Γ-valley verified the validity of our strained model. Simultaneously, the strained Ge1-xSnx alloy experimental results are compared with the calculations by our model. Although the derivation is larger than the strained Ge case, it is reasonable and could be update with more experimental data are used to optimize the input parameters of the 30-band model.

Abstract:

We extend the previous 30-band k.p model effectively employed for relaxed Ge1-xSnx alloy to the case of strained Ge1-xSnx alloy. The strain-relevant parameters for the 30-band k.p model are obtained by using linear interpolation between the values of single crystal of Ge and Sn that are from literatures and optimizations. We specially investigate the dependence of band-gap at L-valley and Γ-valley with different Sn composition under uniaxial and biaxial strain along [100], [110] and [111] directions. The good agreement between our theoretical predictions and experimental data validates the effectiveness of our model. Our 30-band k.p model and relevant input parameters successfully applied to relaxed and strained Ge1-xSnx alloy offers a powerful tool for the optimization of sophisticated devices made from such alloy.
Published in: IEEE Journal of Quantum Electronics ( Volume: 56, Issue: 1, February 2020)
Article Sequence Number: 7100208
Date of Publication: 16 October 2019

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I. Introduction

The Si-based optical platform has attracted considerable interests over the last decade, and its landscape is expanding rapidly with its powerful solutions such as mid-infrared lasers [1], [2], infrared LEDs [3] and photodetectors [4]. There is little doubt that Si photonics is becoming a mature technology as evidenced by its integration in large scale with complementary metal-oxide-semiconductor (CMOS) technology. With all the progress being made, this technology is currently being challenged, however, by the poor efficiency of light emission because of the fundamental material limitation - indirect bandgaps in Si, Ge and SiGe alloy that are employed as building materials for Si-based photonics. One solution that has been investigated extensively over the last decade is to alter their band structure to achieve direct band-gap through material engineering. Realizing the difference between the direct and the indirect bandgap in Si is 2.28eV while that for Ge is only 0.14eV [5], [6], much effort has been directed towards achieving direct bandgap by exploring strain conditions and/or material compositions in Ge or Ge-rich alloy with the goal to lower its -valley below its -valley.

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