Impact Statement:We extend our previous 30-band k·p model to compute electronic band structure of strained Ge1?xSnx alloy at room temperature. Based on it, we carefully investigate the ba...Show More
Abstract:
We extend the previous 30-band k.p model effectively employed for relaxed Ge1-xSnx alloy to the case of strained Ge1-xSnx alloy. The strain-relevant parameters for the 30...Show MoreMetadata
Impact Statement:
We extend our previous 30-band k·p model to compute electronic band structure of strained Ge1?xSnx alloy at room temperature. Based on it, we carefully investigate the bandgap dependence of Ge1-xSnx alloy under uniaxial and biaxial strain along [100] [110] and [111] directions. Besides, the good agreement between our predictions and published results about the bandgap variation at Γ-valley verified the validity of our strained model. Simultaneously, the strained Ge1-xSnx alloy experimental results are compared with the calculations by our model. Although the derivation is larger than the strained Ge case, it is reasonable and could be update with more experimental data are used to optimize the input parameters of the 30-band model.
Abstract:
We extend the previous 30-band k.p model effectively employed for relaxed Ge1-xSnx alloy to the case of strained Ge1-xSnx alloy. The strain-relevant parameters for the 30-band k.p model are obtained by using linear interpolation between the values of single crystal of Ge and Sn that are from literatures and optimizations. We specially investigate the dependence of band-gap at L-valley and Γ-valley with different Sn composition under uniaxial and biaxial strain along [100], [110] and [111] directions. The good agreement between our theoretical predictions and experimental data validates the effectiveness of our model. Our 30-band k.p model and relevant input parameters successfully applied to relaxed and strained Ge1-xSnx alloy offers a powerful tool for the optimization of sophisticated devices made from such alloy.
Published in: IEEE Journal of Quantum Electronics ( Volume: 56, Issue: 1, February 2020)