Thermal conductivity influence on failures of semiconductor ICs under powerful EMP action | IEEE Conference Publication | IEEE Xplore

Thermal conductivity influence on failures of semiconductor ICs under powerful EMP action


First Page of the Article

Date of Conference: 11-16 May 2003
Date Added to IEEE Xplore: 16 May 2005
Print ISBN:0-7803-7779-6
Conference Location: Istanbul, Turkey

First Page of the Article


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