Abstract:
This paper explores the use of microdosimetry with a silicon-on-insulator (SOI) detector for characterizing very-high-energy (VHE), heavy ion beams used specifically for ...Show MoreMetadata
Abstract:
This paper explores the use of microdosimetry with a silicon-on-insulator (SOI) detector for characterizing very-high-energy (VHE), heavy ion beams used specifically for single event effect (SEE) testing of electronics. The detector was deployed at CERN’s heavy ion facility for radiation effects testing and exposed to lead ion beams in the 100 – 1000 MeV per nucleon kinetic energy range. The implications and possible benefits of using microdosimetry for SEE testing purposes are discussed.
Published in: IEEE Transactions on Nuclear Science ( Early Access )
CERN, Geneva 23, Switzerland
CERN, Geneva 23, Switzerland
CERN, Geneva 23, Switzerland
Centre for Medical Radiation Physics, University of Wollongong, Wollongong, NSW, Australia
Centre for Medical Radiation Physics, University of Wollongong, Wollongong, NSW, Australia
Centre for Medical Radiation Physics, University of Wollongong, Wollongong, NSW, Australia
Centre for Medical Radiation Physics, University of Wollongong, Wollongong, NSW, Australia
SINTEF, Oslo, Norway
SINTEF, Oslo, Norway
European Space Agency, AZ, Noordwijk, Netherlands
University of Zurich, Zurich, Switzerland
CERN, Geneva 23, Switzerland
CERN, Geneva 23, Switzerland
CERN, Geneva 23, Switzerland
Centre for Medical Radiation Physics, University of Wollongong, Wollongong, NSW, Australia
Centre for Medical Radiation Physics, University of Wollongong, Wollongong, NSW, Australia
Centre for Medical Radiation Physics, University of Wollongong, Wollongong, NSW, Australia
Centre for Medical Radiation Physics, University of Wollongong, Wollongong, NSW, Australia
SINTEF, Oslo, Norway
SINTEF, Oslo, Norway
European Space Agency, AZ, Noordwijk, Netherlands
University of Zurich, Zurich, Switzerland