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A Two-Story Quad-Core Dual-Mode VCO in 65-nm CMOS | IEEE Journals & Magazine | IEEE Xplore

Abstract:

To simultaneously advance phase noise (PN) performance at a wide frequency-tuning range (FTR) while using the standard supply levels, this letter proposes a multistory mu...Show More

Abstract:

To simultaneously advance phase noise (PN) performance at a wide frequency-tuning range (FTR) while using the standard supply levels, this letter proposes a multistory multicore multimode oscillator topology based on the following ideas: 1) the N number of cores reduces the PN by 10 \log (N) dB, and the circular geometry of inductors promotes their high-quality (Q) -factors and compact layout; 2) the multiple stacked cores exploiting current reuse improve the figure of merit (FoM) using an nMOS-only oscillator configuration under a standard supply; and 3) the multiple modes expand the FTR by leveraging the interstory coupling with all oscillator cores turned on simultaneously, only occupying a single resonator’s footprint. A two-story quad-core dual-mode voltage-controlled oscillator (VCO) prototype is fabricated in 65-nm CMOS. Using a standard 1.2-V supply, it achieves PN of −111.3 to −106.2 dBc/Hz at 1-MHz offset over a 25.0–35.9-GHz FTR (35.8%), a 186.5–189.1-dBc/Hz FoM, and a 197.6–200.2-dBc/Hz \rm {FoM}_{T} (i.e., FoM with normalized FTR).
Published in: IEEE Solid-State Circuits Letters ( Volume: 7)
Page(s): 363 - 366
Date of Publication: 27 November 2024
Electronic ISSN: 2573-9603

Funding Agency:

School of Integrated Circuits, Tsinghua University, Beijing, China
School of Electrical and Electronic Engineering, University College Dublin, Dublin 4, Ireland
School of Integrated Circuits, Tsinghua University, Beijing, China
School of Integrated Circuits, Tsinghua University, Beijing, China
School of Integrated Circuits, Tsinghua University, Beijing, China
School of Integrated Circuits, Tsinghua University, Beijing, China
School of Electrical and Electronic Engineering, University College Dublin, Dublin 4, Ireland
School of Electrical and Electronic Engineering, University College Dublin, Dublin 4, Ireland
Department of Measurement and Electronics, AGH University of Kraków, Kraków, Poland
School of Integrated Circuits, Tsinghua University, Beijing, China
School of Integrated Circuits, Tsinghua University, Beijing, China

School of Integrated Circuits, Tsinghua University, Beijing, China
School of Electrical and Electronic Engineering, University College Dublin, Dublin 4, Ireland
School of Integrated Circuits, Tsinghua University, Beijing, China
School of Integrated Circuits, Tsinghua University, Beijing, China
School of Integrated Circuits, Tsinghua University, Beijing, China
School of Integrated Circuits, Tsinghua University, Beijing, China
School of Electrical and Electronic Engineering, University College Dublin, Dublin 4, Ireland
School of Electrical and Electronic Engineering, University College Dublin, Dublin 4, Ireland
Department of Measurement and Electronics, AGH University of Kraków, Kraków, Poland
School of Integrated Circuits, Tsinghua University, Beijing, China
School of Integrated Circuits, Tsinghua University, Beijing, China
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