Abstract:
This article proposes an on- chip photovoltaic cell equipped with a tunnel oxide passivated contact (TOPCon) exhibiting selective carrier contact. The proposed structure ...Show MoreMetadata
Abstract:
This article proposes an on- chip photovoltaic cell equipped with a tunnel oxide passivated contact (TOPCon) exhibiting selective carrier contact. The proposed structure utilizes the gate region as the TOPCon structure and performs best when the gate oxide is high- \kappa hafnium oxide (HfO2). Oxide thicknesses lower than 1.5 nm enable the utilization of the device as a solar cell; therefore, it can be fabricated using high-end oriented CMOS processes. Furthermore, TOPCon technology at the bulk contact is observed to be more important than that at the emitter contact; however, a combination of the two yields an improved {V}_{\text {OC}} value. On applying the full TOPCon technology, {V}_{\text {OC}} is improved by approximately 20 mV from 601 to 619 mV, and \eta is improved by approximately 0.5% from 15.20% to 15.73% compared to the conventional surface diffusion (SD)-based structure.
Published in: IEEE Transactions on Electron Devices ( Volume: 70, Issue: 4, April 2023)
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- IEEE Keywords
- Index Terms
- Solar Cells ,
- Carrier Selective Contacts ,
- Oxide Thickness ,
- CMOS Process ,
- Gate Oxide ,
- Gate Region ,
- Cell Types ,
- Energy Source ,
- Simulation Model ,
- Active Region ,
- Internet Of Things ,
- Pinhole ,
- Carrier Transport ,
- Contact Region ,
- P-n Junction ,
- Major Carrier ,
- Large-scale Integration ,
- Bulk Region ,
- Gate Length ,
- Total Cell Area
- Author Keywords
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Solar Cells ,
- Carrier Selective Contacts ,
- Oxide Thickness ,
- CMOS Process ,
- Gate Oxide ,
- Gate Region ,
- Cell Types ,
- Energy Source ,
- Simulation Model ,
- Active Region ,
- Internet Of Things ,
- Pinhole ,
- Carrier Transport ,
- Contact Region ,
- P-n Junction ,
- Major Carrier ,
- Large-scale Integration ,
- Bulk Region ,
- Gate Length ,
- Total Cell Area
- Author Keywords