Comparison of On-Wafer Calibrations | IEEE Conference Publication | IEEE Xplore

Comparison of On-Wafer Calibrations


Abstract:

A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance,...Show More

Abstract:

A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance, reference plane offset, and the worst-case measurement deviations of any calibration from a benchmark calibration. The technique is applied to several popular on-wafer scattering parameter calibrations, and the deviations between those calibrations and the thru-reflect line calibration are quantified.
Date of Conference: 05-06 December 1991
Date Added to IEEE Xplore: 12 March 2007
ISBN Information:
Conference Location: San Diego, CA, USA

References

References is not available for this document.