Abstract:
A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance,...Show MoreMetadata
Abstract:
A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance, reference plane offset, and the worst-case measurement deviations of any calibration from a benchmark calibration. The technique is applied to several popular on-wafer scattering parameter calibrations, and the deviations between those calibrations and the thru-reflect line calibration are quantified.
Published in: 38th ARFTG Conference Digest
Date of Conference: 05-06 December 1991
Date Added to IEEE Xplore: 12 March 2007
ISBN Information: