Abstract:
Summary form only given. We report new measurements of SHG in reflection from two-dimensional (2D) layers of Si nanocrystals embedded in the ultrathin (<10 nm) oxide of a...Show MoreMetadata
Abstract:
Summary form only given. We report new measurements of SHG in reflection from two-dimensional (2D) layers of Si nanocrystals embedded in the ultrathin (<10 nm) oxide of a Si[001] wafer by a chemical vapor deposition process.
Published in: 2002 Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference
Date of Conference: 19-24 May 2002
Date Added to IEEE Xplore: 07 May 2003
Print ISBN:1-55752-708-3
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