Abstract:
Summary form only given. We report new measurements of SHG in reflection from two-dimensional (2D) layers of Si nanocrystals embedded in the ultrathin (<10 nm) oxide of a...Show MoreMetadata
Abstract:
Summary form only given. We report new measurements of SHG in reflection from two-dimensional (2D) layers of Si nanocrystals embedded in the ultrathin (<10 nm) oxide of a Si[001] wafer by a chemical vapor deposition process.
Published in: 2002 Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference
Date of Conference: 19-24 May 2002
Date Added to IEEE Xplore: 07 May 2003
Print ISBN:1-55752-708-3
Department of Physics, University of Texas at Austin, Austin, Texas
Department of Physics, University of Texas at Austin, Austin, Texas
Contents Department of Physics, University of Texas at Austin, Austin, Texas
Department of Physics, University of Texas at Austin, Austin, Texas
