Loading [MathJax]/extensions/MathMenu.js
Second harmonic spectroscopy of two-dimensional Si nanocrystal layers | IEEE Conference Publication | IEEE Xplore

Second harmonic spectroscopy of two-dimensional Si nanocrystal layers


Abstract:

Summary form only given. We report new measurements of SHG in reflection from two-dimensional (2D) layers of Si nanocrystals embedded in the ultrathin (<10 nm) oxide of a...Show More

Abstract:

Summary form only given. We report new measurements of SHG in reflection from two-dimensional (2D) layers of Si nanocrystals embedded in the ultrathin (<10 nm) oxide of a Si[001] wafer by a chemical vapor deposition process.
Date of Conference: 19-24 May 2002
Date Added to IEEE Xplore: 07 May 2003
Print ISBN:1-55752-708-3
Conference Location: Long Beach, CA, USA
Department of Physics, University of Texas at Austin, Austin, Texas
Department of Physics, University of Texas at Austin, Austin, Texas

Department of Physics, University of Texas at Austin, Austin, Texas
Department of Physics, University of Texas at Austin, Austin, Texas
Contact IEEE to Subscribe

References

References is not available for this document.