Abstract:
The radiation in harsh environments affects electronic systems, inducing permanent and temporary errors. These effects lead to unpredictable behaviors detrimental to crit...Show MoreMetadata
Abstract:
The radiation in harsh environments affects electronic systems, inducing permanent and temporary errors. These effects lead to unpredictable behaviors detrimental to critical applications and fail-safe systems. This work evaluates the reliability of a fault-tolerant RISC-V System-on-Chip (SoC) under atmospheric neutron irradiation in a particle accelerator. Prior work has analyzed the effectiveness of the hardening techniques of this SoC in simulation and provided a preliminary characterization in an irradiation facility. The applied hardening techniques showed a significant reliability improvement compared to the unhardened implementation of the SoC. The system executed a performance benchmark as workload, which finished correctly in most runs despite suffering from Single Event Effects (SEEs). This work presents a detailed analysis of the experimental results, reporting error rates and classification, extending the analysis given in previous works. Finally, a comprehensive discussion of implementation limitations and the proposition of further improvements are provided.
Published in: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Date of Conference: 19-21 October 2022
Date Added to IEEE Xplore: 30 November 2022
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- IEEE Keywords
- Index Terms
- Fault-tolerant ,
- Neutron Irradiation ,
- Analytical Results ,
- Radiation Facility ,
- Set Of Techniques ,
- Critical Applications ,
- Experimental Setup ,
- Decrease In The Number ,
- Error Detection ,
- Run Test ,
- Core Processes ,
- Point Of Failure ,
- Background Radiation ,
- Random Access Memory ,
- Forward Error Correction ,
- Impact Of Errors ,
- Non-volatile Memory ,
- Internal Components ,
- Instruction Set Architecture ,
- Evaluation Scenarios ,
- Number Of Executions ,
- Galactic Cosmic Rays ,
- Cyclic Redundancy Check ,
- Flash Memory ,
- Avionics ,
- Radiation Tolerance ,
- Memory Control ,
- Commercial Off-the-shelf ,
- Dependability
- Author Keywords
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Fault-tolerant ,
- Neutron Irradiation ,
- Analytical Results ,
- Radiation Facility ,
- Set Of Techniques ,
- Critical Applications ,
- Experimental Setup ,
- Decrease In The Number ,
- Error Detection ,
- Run Test ,
- Core Processes ,
- Point Of Failure ,
- Background Radiation ,
- Random Access Memory ,
- Forward Error Correction ,
- Impact Of Errors ,
- Non-volatile Memory ,
- Internal Components ,
- Instruction Set Architecture ,
- Evaluation Scenarios ,
- Number Of Executions ,
- Galactic Cosmic Rays ,
- Cyclic Redundancy Check ,
- Flash Memory ,
- Avionics ,
- Radiation Tolerance ,
- Memory Control ,
- Commercial Off-the-shelf ,
- Dependability
- Author Keywords