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Comparative analysis of different machine learning techniques for condition monitoring of capacitors in a SEPIC converter | IEEE Conference Publication | IEEE Xplore

Comparative analysis of different machine learning techniques for condition monitoring of capacitors in a SEPIC converter


Abstract:

An efficient condition monitoring technique is essential for power converters to avoid unscheduled maintenance. In this work, the condition monitoring of capacitors in a ...Show More

Abstract:

An efficient condition monitoring technique is essential for power converters to avoid unscheduled maintenance. In this work, the condition monitoring of capacitors in a single-ended primary inductance converter (SEPIC) is proposed based on the following machine learning classifiers: K nearest neighbor, support vector machine, back propagation neural network, Naive Bayes, and deep neural network. The feature of the machine learning algorithms is extracted by three node voltages such as voltage across C 1,C2, and load. These features are utilized for training the algorithms. Moreover, the effectiveness of the different classifies are evaluated by considering the accuracy and area under the curve. Further, each algorithm is trained with a different percentage of a dataset. Finally, a comparative study has been made between the algorithms, and the results exhibit that the deep neural network performs better classification than other algorithms.
Date of Conference: 23-25 September 2022
Date Added to IEEE Xplore: 14 November 2022
ISBN Information:
Conference Location: New Delhi, India

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