Abstract:
This letter reports a linear multiply-accumulate (MAC) operation conducted on a crossbar memory array based on 28nm high-k metal gate (HKMG) Complementary Metal Oxide Sem...Show MoreMetadata
Abstract:
This letter reports a linear multiply-accumulate (MAC) operation conducted on a crossbar memory array based on 28nm high-k metal gate (HKMG) Complementary Metal Oxide Semiconductor (CMOS) and ferroelectric field effect transistor (FeFET). The fabrication is conducted at GlobalFoundries with their standard 28nm technology. The crossbar arrays show a 100% yield in MAC operation on a 300mm wafer. The arrays were divided into {8}\times {8} segments. The FeFET crossbar arrays were fabricated with access transistors, current-limiter transistors and a current-mode analog-to-digital converter (ADC) on the same wafer. Finally, the data retention characteristics reveal excellent data retention characteristics up to {5}\times {10} ^{{4}} seconds, which makes this memory array suitable for carrying out MAC operations in inference engine applications.
Published in: IEEE Electron Device Letters ( Volume: 43, Issue: 12, December 2022)
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- IEEE Keywords
- Index Terms
- Crossbar Array ,
- Ferroelectric Field-effect Transistor ,
- Current Limitations ,
- Analog-to-digital Converter ,
- Field-effect Transistors ,
- Inference System ,
- Data Retention ,
- Retention Characteristics ,
- Metal Gate ,
- Memory Array ,
- Line Source ,
- Input Current ,
- Read Operation ,
- Source Measure Unit ,
- Low Threshold Voltage ,
- Word Line ,
- Current Mirror
- Author Keywords
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Crossbar Array ,
- Ferroelectric Field-effect Transistor ,
- Current Limitations ,
- Analog-to-digital Converter ,
- Field-effect Transistors ,
- Inference System ,
- Data Retention ,
- Retention Characteristics ,
- Metal Gate ,
- Memory Array ,
- Line Source ,
- Input Current ,
- Read Operation ,
- Source Measure Unit ,
- Low Threshold Voltage ,
- Word Line ,
- Current Mirror
- Author Keywords