Thin Film Surface Reconstruction from Interferometry Curvature Measurements | IEEE Conference Publication | IEEE Xplore

Thin Film Surface Reconstruction from Interferometry Curvature Measurements


Abstract:

This work presents a new technique for surface reconstruction based on curvature measurements. The method is robust in the geometries it can handle while also exhibiting ...Show More

Abstract:

This work presents a new technique for surface reconstruction based on curvature measurements. The method is robust in the geometries it can handle while also exhibiting processing times of 131 milliseconds for a 768x768 pixel image.
Date of Conference: 12-14 September 2022
Date Added to IEEE Xplore: 13 October 2022
ISBN Information:
Conference Location: Miramar Beach, FL, USA

Contact IEEE to Subscribe

References

References is not available for this document.