Far-field Calculation from magnetic Huygens Box Data using the Boundary Element Method

In this publication a novel method for far-field prediction from magnetic Huygens box data based on the boundary element method (BEM) is presented. Two examples are considered for the validation of this method. The first example represents an electric dipole so that the obtained calculations can be compared to an analytical solution. As a second example, a printed circuit board is considered and the calculated far-field is compared to a fullwave simulation. In both cases, the calculations for different field integral equations are under comparison, and the results indicate that the presented method performs very well with a combined field integral equation, for the specified problem, when only magnetic Huygens box data is given.

I. Introduction

Near-field measurement was originally developed to characterize antennas, but is increasingly used to determine EMC properties of integrated circuits (ICs) and printed circuit boards (PCBs). For this, typically a near-field scanner is used to measure the electric and magnetic fields of a DUT (Device Under Test) and then a near-field to far-field transformation (NF2FF) is performed [1] [2].