Abstract:
The paper examines the primary testing items & procedures of the USB4.1 Gen3 Compliance Test Specification (CTS), i.e., TX test point (TP) 2 test, TX TP3 test, and RX Str...Show MoreMetadata
Abstract:
The paper examines the primary testing items & procedures of the USB4.1 Gen3 Compliance Test Specification (CTS), i.e., TX test point (TP) 2 test, TX TP3 test, and RX Stress test. The methodology of validating the device under test (DUT) IBIS AMI model against the USB4.1 CTS is described. The roles and impacts of the key parameters are explained and evaluated. A novel approach for inferring the ISI jitter is introduced. The test results obtained through simulation with channels of two representative characteristics are presented. In addition, some concerns associated with the latest standards are discussed, along with proposals for strengthening the clarity of the standard.
Published in: 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
Date of Conference: 01-05 August 2022
Date Added to IEEE Xplore: 26 September 2022
ISBN Information: