Abstract:
In actual manufacturing processes, because of the difference of sampling intervals of different process and quality variables, most of the collected data have characteris...Show MoreMetadata
Abstract:
In actual manufacturing processes, because of the difference of sampling intervals of different process and quality variables, most of the collected data have characteristics of multiple sampling rates. How to fully use those irregular sampling data to realize nonlinear dynamic causality modeling for root cause location and propagation path identification of quality-related faults remains an open question. For this end, a practical root cause diagnosis framework is developed for manufacturing processes with irregular sampling measurements, in which a k -nearest mutual information (MI)-based optimal variable division method is proposed to obtain quality-related and quality-unrelated variables. Then, a sampling interval attention network is designed for adaptively adjusting the dynamic temporal relationships among consecutive samples. Subsequently, a gated recurrent neural network (RNN) for improved design of conditional Granger causality (GC) analysis models is designed for diagnosing root causes and identifying propagation pathways of quality-related faults. Finally, the hot rolling process (HRP) is taken as an example for verification, and the accuracy rate of root cause diagnosis reaches 90.91% and 92.31%, which indicates its practicability and feasibility.
Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 71)
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- IEEE Keywords
- Index Terms
- Manufacturing Process ,
- Irregular Sampling ,
- Diagnosis Framework ,
- Neural Network ,
- Variation In Quality ,
- Recurrent Neural Network ,
- Causal Model ,
- Causal Analysis ,
- Granger Causality ,
- Practical Framework ,
- Propagation Path ,
- Nonlinear Dynamic Model ,
- Granger Causality Analysis ,
- Data Processing ,
- Time Series ,
- Probability Density Function ,
- Direct Cause ,
- Long Short-term Memory ,
- Feed-forward Network ,
- Adjacent Samples ,
- Gated Recurrent Unit ,
- Fault Diagnosis ,
- Bending Force ,
- Results Of Different Algorithms ,
- Canonical Correlation Analysis ,
- Fault Cases ,
- Bias Term ,
- Time Series Prediction ,
- Nonlinear Time Series ,
- Quality Of The Final Product
- Author Keywords
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Manufacturing Process ,
- Irregular Sampling ,
- Diagnosis Framework ,
- Neural Network ,
- Variation In Quality ,
- Recurrent Neural Network ,
- Causal Model ,
- Causal Analysis ,
- Granger Causality ,
- Practical Framework ,
- Propagation Path ,
- Nonlinear Dynamic Model ,
- Granger Causality Analysis ,
- Data Processing ,
- Time Series ,
- Probability Density Function ,
- Direct Cause ,
- Long Short-term Memory ,
- Feed-forward Network ,
- Adjacent Samples ,
- Gated Recurrent Unit ,
- Fault Diagnosis ,
- Bending Force ,
- Results Of Different Algorithms ,
- Canonical Correlation Analysis ,
- Fault Cases ,
- Bias Term ,
- Time Series Prediction ,
- Nonlinear Time Series ,
- Quality Of The Final Product
- Author Keywords