I. Introduction
In the semiconductor manufacturing industry, Process control and final products’ quality are intimately linked during manufacturing, and their enhancement directly impacts productivity and quality. Therefore, semiconductor facility owners use the best possible solutions to have effective process control and monitoring systems that allow them to achieve productivity targets, final product quality requirements, desired production costs, and delivery times. The alarm system constitutes an essential part of the facility automation system and a significant role in manufacturing operations monitoring. It communicates to the control system and the operator any abnormal situation, process deviation, or equipment malfunctions that requires a timely response [1]. According to a predefined configuration and limits, these abnormal situations or faults are determined using equipment sensor real-time data. They might also be considered as sources of quality problems that are usually detected at the final test or after a customer return. The final quality prediction based on collected data history is very considerable to provide early information about the final product health state and support decision making.