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c-Eval: A Unified Metric to Evaluate Feature-based Explanations via Perturbation | IEEE Conference Publication | IEEE Xplore

c-Eval: A Unified Metric to Evaluate Feature-based Explanations via Perturbation


Abstract:

In many image-classification applications, understanding the reasons of model’s prediction can be as critical as the prediction’s accuracy itself. Various feature-based l...Show More

Abstract:

In many image-classification applications, understanding the reasons of model’s prediction can be as critical as the prediction’s accuracy itself. Various feature-based local explainers have been designed to provide explanations on the decision of complex classifiers. Nevertheless, there is no consensus on evaluating the quality of different explanations. In response to this lack of comprehensive evaluation, we introduce the c-Eval metric and its corresponding framework to quantify the feature-based local explanation’s quality. Given a classifier’s prediction and the corresponding explanation on that prediction, c-Eval is the minimum-distortion perturbation that successfully alters the prediction while keeping the explanation’s features unchanged. To show that c-Eval captures the importance of input’s features, we establish a connection between c-Eval and the features returned by explainers in affine and nearly-affine classifiers. We then introduce the c-Eval plot, which not only displays a strong connection between c-Eval and explainers’ quality, but also helps automatically determine explainer’s parameters.
Date of Conference: 15-18 December 2021
Date Added to IEEE Xplore: 13 January 2022
ISBN Information:
Conference Location: Orlando, FL, USA

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