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HV ESD Device Solution Evaluations in 55nm BCD Technology | IEEE Conference Publication | IEEE Xplore

HV ESD Device Solution Evaluations in 55nm BCD Technology


Abstract:

Effective High-Voltage (HV) ESD (Electrostatic Discharge) solutions for 12V power pad protection in 55nm BCDLite® were studied in this paper. A comparison between differe...Show More

Abstract:

Effective High-Voltage (HV) ESD (Electrostatic Discharge) solutions for 12V power pad protection in 55nm BCDLite® were studied in this paper. A comparison between different types of devices, gate-grounded NMOS (GGNMOS), PNP, and NPN for HV ESD protection with key performance metrics were studied.
Date of Conference: 15 September 2021 - 15 October 2021
Date Added to IEEE Xplore: 29 November 2021
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Conference Location: Singapore, Singapore

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