Utilization of Thin-film to Control Total Phase Shift during Total-internal-reflection

This paper analytically describes the concept of controlling total phase shifts accompanying the propagation of p- and s-polarized light at the interface between two transparent dielectric media. This has been achieved by introducing a thin-film of specific refractive index and thickness. Generalized expression for the phase shifts have been formularized. Computer aided analysis has been carried out using isotropic semiconductor slab coated with different thin-films.