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Reliability Evaluation of FPGA with Common Cause Failure in Multi-Phase Mission | IEEE Conference Publication | IEEE Xplore

Reliability Evaluation of FPGA with Common Cause Failure in Multi-Phase Mission


Abstract:

As an important part of space electronic system, static random-access memory (SRAM)-based field-programmable gate arrays (FPGAs) are inevitably affected by single-event u...Show More

Abstract:

As an important part of space electronic system, static random-access memory (SRAM)-based field-programmable gate arrays (FPGAs) are inevitably affected by single-event upsets caused by space radiation. Although triple-modular redundancy, as one of the main mitigation strategies, plays an important role in improving the system reliability, the common cause failure (CCF) in redundant components is still one of the factors threatening the system reliability. In addition, CCF increases the complexity of reliability analysis when considering the implementation of phased mission. We propose an effective method to incorporate CCF into the reliability analysis of the phased-mission system (PMS). Based on the continuous-time Markov chain and multiple beta factor theory, we establish the dynamic behavior model of the system considering CCF under single-phase condition, and realize the transformation of multi-phase tasks based on the Erlang distribution. Our method can be easily implemented in PRISM, a probabilistic model checker, in which various properties of the system can be automatically verified. The analysis and discussion of this paper can provide useful insights for relevant researchers and realize automatic reliability analysis.
Date of Conference: 11-14 December 2020
Date Added to IEEE Xplore: 11 December 2020
ISBN Information:
Conference Location: Macau, China

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