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Welcome Message from SenSys-ML'20 Chairs | IEEE Conference Publication | IEEE Xplore

Welcome Message from SenSys-ML'20 Chairs


Abstract:

We are very excited to welcome you to the second ACM/IEEE International Workshop on Machine Learning on Edge in Sensor Systems (SenSys-ML 2020). SenSys-ML’20 will be held...Show More

Abstract:

We are very excited to welcome you to the second ACM/IEEE International Workshop on Machine Learning on Edge in Sensor Systems (SenSys-ML 2020). SenSys-ML’20 will be held in conjunction with the CPS-IoT Week 2020 and focuses on work that combines sensor signals from the physical world with machine learning, particularly in ways that are distributed to the device or use edge and fog computing. The development and deployment of ML at the very edge remains a technological challenge constrained by computing, memory, energy, network bandwidth, and data privacy and security limitations. This is especially true for battery-operated devices and always-on use cases and applications. In recent years this has gained attention from both academia and industry and many TinyML initiatives have been started focusing both in hardware and software advancements. This workshop will provide a forum for sensing, networking and machine learning researchers to present and share their latest research on building machine learning-enabled sensor systems. Sensys-ML focuses on providing extensive feedback on Work-In-Progress papers involving machine learning (TinyML/ UltraML) on sensor systems. Many papers were submitted from multiple countries, and four papers were selected for publication. This year our articles had themes including techniques for collecting low-resolution images from thermal cameras for human activity recognition, VAE-based approach for privacy preservation of sensor data, deep model compression techniques, and novel GRU based shallow Neural Networks. We see advancement and contributions made by research work will have a significant impact on real-world applications and future research directions.
Date of Conference: 21-21 April 2020
Date Added to IEEE Xplore: 09 June 2020
ISBN Information:
Conference Location: Sydney, NSW, Australia