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Dual-Polarized Probe for Millimeter-Wave Multi-Probe Spherical Near Field Measurement System | IEEE Conference Publication | IEEE Xplore

Dual-Polarized Probe for Millimeter-Wave Multi-Probe Spherical Near Field Measurement System


Abstract:

In this paper a broadband dual-polarization probe has been designed and simulated which can be used for 5G millimeter-wave frequency band (below 50GHz) measuring. The pro...Show More

Abstract:

In this paper a broadband dual-polarization probe has been designed and simulated which can be used for 5G millimeter-wave frequency band (below 50GHz) measuring. The probe not only has a wide impedance matching bandwidth, but also has no deterioration of the pattern of the interested frequency band. At the same time, the structure is simple and occupy small volume. The simulation results show that the impedance bandwidth of the probe proposed to this paper is 6-50GHz, and the isolation between the ports is more than 30dB in the whole frequency band, and it has good radiation performance and cross-polarization level. Therefore, this probe can find a scene in 5G millimeter wave frequency band measurement application, especially in multi-probe spherical near-field measurement system.
Date of Conference: 25-28 February 2020
Date Added to IEEE Xplore: 04 May 2020
ISBN Information:
Conference Location: Bucharest, Romania

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