Abstract:
With storage and computation happening at the same place, computing in resistive crossbars minimizes data movement and avoids the memory bottleneck issue. It leads to ult...Show MoreMetadata
Abstract:
With storage and computation happening at the same place, computing in resistive crossbars minimizes data movement and avoids the memory bottleneck issue. It leads to ultra-high energy efficiency for data-intensive applications. However, defects in crossbars severely affect computing accuracy. Existing solutions, including re-training with defects and redundant designs, but they have limitations in practical implementations. In this work, we introduce row shuffling and output compensation to mitigate defects without re-training or redundant resistive crossbars. We also analyzed the coupling effects of defects and circuit parasitics. Moreover, We study different combinations of methods to achieve the best trade-off between cost and performance. Our proposed methods could rescue up to 10% defects in ResNet-20 application without performance degradation.
Date of Conference: 13-16 January 2020
Date Added to IEEE Xplore: 26 March 2020
ISBN Information:
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- IEEE Keywords
- Index Terms
- Matrix Multiplication ,
- Resistive Crossbar ,
- Parasitic Effects ,
- Combination Of Different Methods ,
- Memory Wall ,
- Classification Accuracy ,
- Linear Function ,
- Weight Matrix ,
- Input Voltage ,
- Output Neurons ,
- Assignment Problem ,
- Phase Change Materials ,
- Circuit Simulation ,
- Patterning Defects ,
- Conductance States ,
- Digital Circuits ,
- Jth Column ,
- Defect Rate ,
- Conductive Matrix ,
- Kirchhoff’s Current Law ,
- Impact Of Defects ,
- Digital Components ,
- Wire Resistance ,
- Mapping Stage ,
- Impact Of Parasites ,
- Crossbar Array ,
- Software Implementation ,
- Implementation Of Strategies
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Matrix Multiplication ,
- Resistive Crossbar ,
- Parasitic Effects ,
- Combination Of Different Methods ,
- Memory Wall ,
- Classification Accuracy ,
- Linear Function ,
- Weight Matrix ,
- Input Voltage ,
- Output Neurons ,
- Assignment Problem ,
- Phase Change Materials ,
- Circuit Simulation ,
- Patterning Defects ,
- Conductance States ,
- Digital Circuits ,
- Jth Column ,
- Defect Rate ,
- Conductive Matrix ,
- Kirchhoff’s Current Law ,
- Impact Of Defects ,
- Digital Components ,
- Wire Resistance ,
- Mapping Stage ,
- Impact Of Parasites ,
- Crossbar Array ,
- Software Implementation ,
- Implementation Of Strategies