Abstract:
The 5G revolution brings a lot innovative impact in various applications and business opportunities in mobility, automotive, insdustrial automation and healthcare globall...Show MoreMetadata
Abstract:
The 5G revolution brings a lot innovative impact in various applications and business opportunities in mobility, automotive, insdustrial automation and healthcare globally. Therefore, the muti-function integration, form factor miniaturization and time to market of IC package design become the necessary trend in electronic assembly technology. Obviously, system in package (SiP) is the capable solution to meet these requirments and widely applied in the IOT, automotive and sensor module currently. However, the conventional singulation process by blade sawing technology exists the burr residual, inflexible package shape forming and inaccuracy tolerance controlling challenges that brings about low yield and limited package shape design.In this research, the sigulation and metal lid by laser ablation technology in various system in package applications are demonstrated, the metal lid discoloration and burr residual defeat are successfully eliminated by pico second pulses laser technology which shorten the energy absorption time from laser light to electrons and improve the heat-affected zone (HAZ) damage on sawing edge during the ablation process. Therefore, the design of experiment (DOE) shows that the metal lid discoloration rate have been greatly improved from 25% to 0% and without the burr residual issue by utilizing UV laser ablation process. In addition, the package shape forming by UV laser is also studied in this paper, the various geometrical shape that including circle, hexagon and qctagon package appearance are fabricated within 30 um cutting tolerance while without any chipping residual on cutting edge, thus, this formnig technology have been widely applied in various fingerprint sensor and particular module applications in smartphone and automotive industry.The typical reliability testing (Temperature Cycle Test, Hight Temperature Storage Test and unbias HAST) results as a verification. By employing this advanced UV laser ablation technology, the package for...
Published in: 2019 14th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
Date of Conference: 23-25 October 2019
Date Added to IEEE Xplore: 05 March 2020
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