Test Automation and Its Limitations: A Case Study | IEEE Conference Publication | IEEE Xplore

Test Automation and Its Limitations: A Case Study


Abstract:

Modern embedded systems are increasingly complex and contain multiple software layers from BSP (Board Support Packages) to OS to middleware to AI (Artificial Intelligence...Show More

Abstract:

Modern embedded systems are increasingly complex and contain multiple software layers from BSP (Board Support Packages) to OS to middleware to AI (Artificial Intelligence) algorithms like perception and voice recognition. Integrations of inter-layer and intra-layer in embedded systems provide dedicated services such as taking a picture or movie-streaming. Accordingly, it gets more complicated to find out the root cause of a system failure. This industrial proposal describes a difficulty of testing embedded systems, and presents a case study in terms of integration testing.
Date of Conference: 11-15 November 2019
Date Added to IEEE Xplore: 09 January 2020
ISBN Information:

ISSN Information:

Conference Location: San Diego, CA, USA

Contact IEEE to Subscribe

References

References is not available for this document.