Scene Classification: A Comprehensive Study Combining Local and Global Descriptors | IEEE Conference Publication | IEEE Xplore

Scene Classification: A Comprehensive Study Combining Local and Global Descriptors


Abstract:

In this paper, local region characteristics and overall structure of scene images are used for scene classification by combining different local and global descriptors. F...Show More

Abstract:

In this paper, local region characteristics and overall structure of scene images are used for scene classification by combining different local and global descriptors. For this purpose, GIST, Histogram of Oriented Gradients (HOG), dense Scale-Invariant Feature Transform (SIFT), dense Speed-Up Robust Features (SURF), Daisy and Local Binary Patterns (LBP) features are classified individually and jointly with Support Vector Machine (SVM) by using different sizes of training sets. Evaluation tests were conducted on Places15, MIT indoor, SUN397 and Places365 datasets. Most used machine learning algorithms in scene classification literature -SVM with RBF and linear kernels, K-Nearest Neighbors and Random Forest- were evaluated on Places15 dataset for comparison. Besides accuracy, recall and precision, processing time for testing with SVM was measured individually and jointly for a deeper evaluation of the features.
Date of Conference: 24-26 April 2019
Date Added to IEEE Xplore: 22 August 2019
ISBN Information:
Print on Demand(PoD) ISSN: 2165-0608
Conference Location: Sivas, Turkey

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