Die to Wafer/Die DBI Hybrid Bonding for a True 3D Interconnect | IEEE Conference Publication | IEEE Xplore

Die to Wafer/Die DBI Hybrid Bonding for a True 3D Interconnect


Abstract:

Though DBI (Direct Bonding Interconnect) wafer to wafer has been widely reported and already implemented in the industry, in this talk, we will focus on die to die and di...Show More

Abstract:

Though DBI (Direct Bonding Interconnect) wafer to wafer has been widely reported and already implemented in the industry, in this talk, we will focus on die to die and die to wafer assembly, its reliability and readiness to enter the market applications where the stacking yield is paramount.
Date of Conference: 21-25 May 2019
Date Added to IEEE Xplore: 13 June 2019
ISBN Information:
Conference Location: Kanazawa, Japan

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