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Hardware and Software Combined Detection of SystemLevel ESD-Induced Soft Failures | IEEE Conference Publication | IEEE Xplore

Hardware and Software Combined Detection of SystemLevel ESD-Induced Soft Failures


Abstract:

A semi-custom microcontroller is subjected to IEC-61000-4-2 ESD. A scan chain and memory read-out programs enable identification of the hardware blocks that experience so...Show More

Abstract:

A semi-custom microcontroller is subjected to IEC-61000-4-2 ESD. A scan chain and memory read-out programs enable identification of the hardware blocks that experience soft failures. Voltage monitors are used to correlate the occurrence of those failures with the magnitude of noise on power supplies.
Date of Conference: 23-28 September 2018
Date Added to IEEE Xplore: 28 October 2018
ISBN Information:
Print on Demand(PoD) ISSN: 0739-5159
Conference Location: Reno, NV, USA

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