Abstract:
A semi-custom microcontroller is subjected to IEC-61000-4-2 ESD. A scan chain and memory read-out programs enable identification of the hardware blocks that experience so...Show MoreMetadata
Abstract:
A semi-custom microcontroller is subjected to IEC-61000-4-2 ESD. A scan chain and memory read-out programs enable identification of the hardware blocks that experience soft failures. Voltage monitors are used to correlate the occurrence of those failures with the magnitude of noise on power supplies.
Date of Conference: 23-28 September 2018
Date Added to IEEE Xplore: 28 October 2018
ISBN Information:
Print on Demand(PoD) ISSN: 0739-5159