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On-chip voltage noise monitor for measuring voltage bounce in power supply lines using a digital tester | IEEE Conference Publication | IEEE Xplore

On-chip voltage noise monitor for measuring voltage bounce in power supply lines using a digital tester


Abstract:

With increasing interconnect densities, voltage bounce noise in power supply lines is becoming an important problem. In this paper, we describe a method to measure voltag...Show More

Abstract:

With increasing interconnect densities, voltage bounce noise in power supply lines is becoming an important problem. In this paper, we describe a method to measure voltage bounce in a power supply line on a chip. We use a voltage comparator circuit to make the output a digital value. We connect this circuit in series to output the results with less pins.
Date of Conference: 16-16 March 2000
Date Added to IEEE Xplore: 15 April 2003
Print ISBN:0-7803-6275-7
Conference Location: Monterey, CA, USA

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