Abstract:
With increasing interconnect densities, voltage bounce noise in power supply lines is becoming an important problem. In this paper, we describe a method to measure voltag...Show MoreMetadata
Abstract:
With increasing interconnect densities, voltage bounce noise in power supply lines is becoming an important problem. In this paper, we describe a method to measure voltage bounce in a power supply line on a chip. We use a voltage comparator circuit to make the output a digital value. We connect this circuit in series to output the results with less pins.
Published in: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)
Date of Conference: 16-16 March 2000
Date Added to IEEE Xplore: 15 April 2003
Print ISBN:0-7803-6275-7