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Application of TMS, TMGe to high-energy X-ray tomography | IEEE Journals & Magazine | IEEE Xplore

Application of TMS, TMGe to high-energy X-ray tomography


Abstract:

The ionic mobilities of two organometallic compounds, TMS (tetramethylsilane) and TMGe (tetramethylgermanium), were measured. A TMGe detector designed for high-energy tom...Show More

Abstract:

The ionic mobilities of two organometallic compounds, TMS (tetramethylsilane) and TMGe (tetramethylgermanium), were measured. A TMGe detector designed for high-energy tomography was successfully tested on a 100 Hz pulsed X-ray beam produced by a 8 MeV linear accelerator; a dynamic range of five decades was measured, corresponding to 25 cm lead attenuation, with a max dose rate of 0.43 rad/s. The ratio between the electronic pulse current and the ionic interpulse current, mostly dependent on the duty cycle, was improved by means of an electronic circuit integrating during and just before the pulse.<>
Published in: IEEE Transactions on Electrical Insulation ( Volume: 26, Issue: 4, August 1991)
Page(s): 631 - 635
Date of Publication: 06 August 2002

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