Abstract:
Perovskite photovoltaic devices have demonstrated a very rapid rise in reported efficiencies. Potentially extreme artifacts which tend to manifest themselves as large hys...Show MoreMetadata
Abstract:
Perovskite photovoltaic devices have demonstrated a very rapid rise in reported efficiencies. Potentially extreme artifacts which tend to manifest themselves as large hysteresis effects, depending an scan rates and directions and light bias exposure history are often seen. This can make characterization difficult and may have resulted in some exaggerated efficiency reports. NREL's Cell and Module Performance (CMP) group's approach to standardized measurements of perovskites is discussed.
Published in: 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
Date of Conference: 25-30 June 2017
Date Added to IEEE Xplore: 04 November 2018
ISBN Information: