Abstract:
To address the problem of non-well controlled face recognition, such as illumination changes, pose variation and random pixel corruption, we propose a robust face recogni...Show MoreMetadata
Abstract:
To address the problem of non-well controlled face recognition, such as illumination changes, pose variation and random pixel corruption, we propose a robust face recognition method based on representation and feature extraction of residual images. Represented by sparse representation and linear regression, linear representation methods typically use training samples to represent and reconstruct test samples, and determine classification results according to the distance between test samples and reconstruction samples. In this paper, we consider to use linear regression to obtain reconstruction samples of the test sample with respect to each subject, and compute residual images by the difference between test sample and reconstruction samples. Then we analyze intensity distribution of residual images between the correct subject and other subjects, and adopt intensity transform to surpass the intra-class difference and strengthen the inter-class difference. Finally, we use wavelet decomposition to extract global intensity distribution of residual images, and introduce information entropy to illustrate the uncertainty of intensity distribution, which are extracted as discriminating features. Compared with several popular face recognition methods, the efficacy of the proposed method is verified on four popular face databases (i.e., ORL, Extended Yale B, Georgia Tech and AR) with promising results.
Date of Conference: 15-17 December 2017
Date Added to IEEE Xplore: 01 March 2018
ISBN Information:
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Face Recognition ,
- Image Representation ,
- Image Feature Extraction ,
- Residual Feature ,
- Extract Residue ,
- Face Recognition Methods ,
- Residual Feature Extraction ,
- Linear Regression ,
- Test Samples ,
- Global Distribution ,
- Discriminative Features ,
- Sparse Representation ,
- Distribution Of Images ,
- Information Entropy ,
- Recognition Problem ,
- Linear Representation ,
- Extract Image ,
- Wavelet Decomposition ,
- Robust Recognition ,
- Training Set ,
- Face Images ,
- Low-frequency Components ,
- Recognition Rate ,
- Sunglasses ,
- Nuclear Norm ,
- Grayscale ,
- Labeled Samples ,
- Final Results ,
- Facial Features
- Author Keywords
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Face Recognition ,
- Image Representation ,
- Image Feature Extraction ,
- Residual Feature ,
- Extract Residue ,
- Face Recognition Methods ,
- Residual Feature Extraction ,
- Linear Regression ,
- Test Samples ,
- Global Distribution ,
- Discriminative Features ,
- Sparse Representation ,
- Distribution Of Images ,
- Information Entropy ,
- Recognition Problem ,
- Linear Representation ,
- Extract Image ,
- Wavelet Decomposition ,
- Robust Recognition ,
- Training Set ,
- Face Images ,
- Low-frequency Components ,
- Recognition Rate ,
- Sunglasses ,
- Nuclear Norm ,
- Grayscale ,
- Labeled Samples ,
- Final Results ,
- Facial Features
- Author Keywords