Abstract:
Although bi-directional analog switching capability is crucial for neuromorphic computing application, it is still difficult to be realized in filamentary RRAM cells. Thi...Show MoreMetadata
Abstract:
Although bi-directional analog switching capability is crucial for neuromorphic computing application, it is still difficult to be realized in filamentary RRAM cells. This work investigates the physical mechanism of the abrupt switching to the analog switching transition using Kinetic Monte Carlo simulation method. A disorder-related model for oxygen vacancy distribution is proposed with an order parameter Oy to quantify the analog behaviors of different RRAM devices. The simulation results and model predictions are verified by experiments performed on 1kb RRAM array. It is suggested that disordered oxygen vacancy distribution is desired for analog switching. Optimization guideline for improving the analog performance of filamentary RRAM is provided.
Published in: 2017 IEEE International Electron Devices Meeting (IEDM)
Date of Conference: 02-06 December 2017
Date Added to IEEE Xplore: 25 January 2018
ISBN Information:
Electronic ISSN: 2156-017X
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- Index Terms
- Neuromorphic Computing ,
- Resistive Random Access Memory ,
- Oxygen Vacancy Distribution ,
- Simulation Results ,
- Monte Carlo Simulation ,
- Simulation Method ,
- Order Parameter ,
- Switching Mechanism ,
- Analogous Behavior ,
- Monte Carlo Simulation Method ,
- Bidirectional Switch ,
- Abrupt Switching ,
- High Temperature ,
- Levels Of Resistance ,
- Experimental Verification ,
- Current Distribution ,
- Device Structure ,
- Temperature Coefficient ,
- Noise Amplitude ,
- Device-to-device ,
- Local High Temperature ,
- Reset Process
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- Index Terms
- Neuromorphic Computing ,
- Resistive Random Access Memory ,
- Oxygen Vacancy Distribution ,
- Simulation Results ,
- Monte Carlo Simulation ,
- Simulation Method ,
- Order Parameter ,
- Switching Mechanism ,
- Analogous Behavior ,
- Monte Carlo Simulation Method ,
- Bidirectional Switch ,
- Abrupt Switching ,
- High Temperature ,
- Levels Of Resistance ,
- Experimental Verification ,
- Current Distribution ,
- Device Structure ,
- Temperature Coefficient ,
- Noise Amplitude ,
- Device-to-device ,
- Local High Temperature ,
- Reset Process