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OP-AMP sizing by inference of element values using machine learning | IEEE Conference Publication | IEEE Xplore

OP-AMP sizing by inference of element values using machine learning


Abstract:

Along with high performance of electronic appliances, prolongation of the design period is becoming a big issue. If this problem can be solved, time spent on design can b...Show More

Abstract:

Along with high performance of electronic appliances, prolongation of the design period is becoming a big issue. If this problem can be solved, time spent on design can be used for circuit performance improvement and development of new circuits. Therefore, efficient circuit design through the assist of computer is required to further improve productivity. Some automatic circuit design methods have been proposed. However, these methods are unsuitable for designing a lot of circuits because it consumes a lot of time to design the new circuit. In this paper, an automatic design method of OP-Amp sizing by inference of machine learning is proposed, and predicts the element value of the circuit. From the simulation results, we succeeded in predicting element values of a circuit that satisfies the desired characteristic about 90% accuracy and shortening the design time.
Date of Conference: 06-09 November 2017
Date Added to IEEE Xplore: 22 January 2018
ISBN Information:
Conference Location: Xiamen, China

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