I. Introduction
The integrated circuit (IC) manufacturing industry has developed extremely rapidly to follow Moore's Law, when the IC process technology comes to the nanometer regime, the complexity and cost of the fabrication process rises dramatically. A wafer in the production cycle will go through hundreds of different process operations taking several months to finish. During this time, typically very little information of the final product quality is collected, resulting in high level of uncertainty of die yield which directly affects the cost and profit of the enterprise.