Abstract:
We present single event transient (SET) and total ionizing dose (TID) data for the single channel voltage supervisor fabricated in a 0.35μm triple-well, mixed-signal CMOS...Show MoreMetadata
Abstract:
We present single event transient (SET) and total ionizing dose (TID) data for the single channel voltage supervisor fabricated in a 0.35μm triple-well, mixed-signal CMOS process.
Published in: 2017 IEEE Radiation Effects Data Workshop (REDW)
Date of Conference: 17-21 July 2017
Date Added to IEEE Xplore: 23 November 2017
ISBN Information:
Electronic ISSN: 2154-0535
Contents 