A robust ellipse fitting algorithm based on sparsity of outliers | IEEE Conference Publication | IEEE Xplore

A robust ellipse fitting algorithm based on sparsity of outliers


Abstract:

Ellipse fitting is widely used in computer vision and pattern recognition algorithms such as object segmentation and pupil/eye tracking. Generally, ellipse fitting is fin...Show More

Abstract:

Ellipse fitting is widely used in computer vision and pattern recognition algorithms such as object segmentation and pupil/eye tracking. Generally, ellipse fitting is finding the best ellipse parameters that can be fitted on a set of data points, which are usually noisy and contain outliers. The algorithms of fitting the best ellipse should be both suitable for real-time applications and robust against noise and outliers. In this paper, we introduce a new method of ellipse fitting which is based on sparsity of outliers and robust Huber's data fitting measure. We will see that firstly this approach is theoretically better justified than a state-of-the-art ellipse fitting algorithm based on sparse representation. Secondly, simulation results show that it provides a better robustness against outliers compared to some previous ellipse fitting approaches, while being even faster.
Date of Conference: 28 August 2017 - 02 September 2017
Date Added to IEEE Xplore: 26 October 2017
ISBN Information:
Electronic ISSN: 2076-1465
Conference Location: Kos, Greece

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