Abstract:
ATPG is about test functionality that leads to test patterns to determine the quality of a chip. Traditionally, this technology has been available at the gate level and t...Show MoreMetadata
Abstract:
ATPG is about test functionality that leads to test patterns to determine the quality of a chip. Traditionally, this technology has been available at the gate level and this paper describes the need to move higher. High Level is defined as any level in the abstraction chain that is above gates. DRC and DFT technology have already moved to higher levels of abstraction. If necessity is the mother of invention, High Level ATPG is not far behind because the need is there.
Date of Conference: 30-30 September 1999
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-5753-1
Print ISSN: 1089-3539
