A High Frame Rate Test System for the HEPS-BPIX Based on NI-sbRIO Board

HEPS-BPIX is a silicon pixel detector designed for the future large scientific facility, high-energy photon sources (HEPS) in Beijing, China. It is a high frame rate hybrid pixel detector which works in the single-photon-counting mode. High frame rate leads to much higher readout data bandwidth than former systems, which is also the difficulty of the design. Aiming to test and calibrate the pixel detector, a test system based on the National Instruments single-board RIO 9626 and LabVIEW program environment has been designed. A series of tests has been carried out with X-ray machine as well as on the Beijing Synchrotron Radiation Facility 1W2B beamline. The test results show that the threshold uniformity is better than 60 electrons and the equivalent noise charge is less than 120 electrons. Besides, the required highest frame rate of 1.2 kHz has been realized. This paper will elaborate the test system design and present the latest testing results of the HEPS-BPIX system.