I. Introduction
Soft errors, i.e. erroneous bits occurring without hardware defect, have become a significant concern for digital designers in many application domains of embedded market. Such errors can be caused by natural phenomena such as particle impacts [1] but also by malicious attacks using for example lasers [2]. In the first case, impacted applications include space and avionics but also more and more applications at ground level such as automotive or critical process control. The second case concerns circuits with security-related features, using secret data such as encryption keys. Coping with soft errors is therefore a major constraint to improve safety, availability and also security.