Simple technique for the measurement of thermal time constants of microbolometer structures | IEEE Conference Publication | IEEE Xplore

Simple technique for the measurement of thermal time constants of microbolometer structures


Abstract:

A straightforward electrical technique for determining the thermal time constant of microbolometer structures is presented. An impedance measurement of a microbolometer u...Show More

Abstract:

A straightforward electrical technique for determining the thermal time constant of microbolometer structures is presented. An impedance measurement of a microbolometer using an LCR meter shows that the phase lag/lead reaches a maximum as a function of frequency. It is shown that the frequency of maximum phase difference is simply related to the thermal time constant.
Date of Conference: 15-18 March 1999
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-5270-X
Conference Location: Gothenburg, Sweden

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