Abstract:
Run-time solutions based on online monitoring and adaptation are required for resilience in nanoscale integrated circuits, as design-time solutions and guard bands are no...Show MoreMetadata
Abstract:
Run-time solutions based on online monitoring and adaptation are required for resilience in nanoscale integrated circuits, as design-time solutions and guard bands are no longer sufficient. Bias temperature instability-induced transistor aging, one of the major reliability threats in nanoscale very large scale integration, degrades path delay over time and may lead to timing failures. Chip health monitoring is, therefore, necessary to track delay changes on a per-chip basis over the chip lifetime operation. However, direct monitoring based on actual measurement of path delays can only track a coarse-grained aging trend in a reactive manner, not suitable for proactive fine-grain adaptations. In this paper, we propose a low cost and fine-grained workload-induced stress monitoring approach, based on machine learning techniques, to accurately predict aging-induced delay. We integrate space and time sampling of selective flip-flops into the runtime monitoring infrastructure in order to reduce the cost of monitoring the workload. The prediction model is trained offline using support-vector regression and implemented in software. This approach can leverage proactive adaptation techniques to mitigate further aging of the circuit by monitoring aging trends. Simulation results for realistic open-source benchmark circuits highlight the accuracy of the proposed approach.
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ( Volume: 37, Issue: 5, May 2018)
Funding Agency:
Karlsruhe Institute of Technology, Karlsruhe, Germany
Arunkumar Vijayan received the bachelor’s degree from the Cochin University of Science and Technology, Kochi, India, in 2009, and the master’ degree in microelectronics and very large scale integration from the Indian Institute of Technology Bombay, Mumbai, India. He is currently pursuing the Ph.D. degree with the CDNC Group, Karlsruhe Institute of Technology, Karlsruhe, Germany, under the supervision of Prof. M. Tahoori.
...Show More
Arunkumar Vijayan received the bachelor’s degree from the Cochin University of Science and Technology, Kochi, India, in 2009, and the master’ degree in microelectronics and very large scale integration from the Indian Institute of Technology Bombay, Mumbai, India. He is currently pursuing the Ph.D. degree with the CDNC Group, Karlsruhe Institute of Technology, Karlsruhe, Germany, under the supervision of Prof. M. Tahoori.
...View more
Duke University, Durham, NC, USA
Abhishek Koneru received the B.Tech. and M.Tech. degrees in electrical engineering from the Indian Institute of Technology Kanpur, Kanpur, India, in 2014. He is currently pursuing the Ph.D. degree in electrical and computer engineering from Duke University, Durham, NC, USA.
He was an Intern with Intel Corporation, Santa Clara, CA, USA, and TSMC Technology Inc., San Jose, CA, USA. His current research interests include test...Show More
Abhishek Koneru received the B.Tech. and M.Tech. degrees in electrical engineering from the Indian Institute of Technology Kanpur, Kanpur, India, in 2014. He is currently pursuing the Ph.D. degree in electrical and computer engineering from Duke University, Durham, NC, USA.
He was an Intern with Intel Corporation, Santa Clara, CA, USA, and TSMC Technology Inc., San Jose, CA, USA. His current research interests include test...View more
Karlsruhe Institute of Technology, Karlsruhe, Germany
Saman Kiamehr received the B.Sc. degree in electrical engineering from Sharif University, Tehran, Iran, in 2006, the M.Sc. degree in electrical engineering from the University of Tehran, Tehran, Iran, in 2010, and the Ph.D. degree in computer science and engineering from the Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, in 2015.
Since 2015, he has been a Research Group Leader with the Chair of Dependable Nan...Show More
Saman Kiamehr received the B.Sc. degree in electrical engineering from Sharif University, Tehran, Iran, in 2006, the M.Sc. degree in electrical engineering from the University of Tehran, Tehran, Iran, in 2010, and the Ph.D. degree in computer science and engineering from the Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, in 2015.
Since 2015, he has been a Research Group Leader with the Chair of Dependable Nan...View more
Duke University, Durham, NC, USA
Krishnendu Chakrabarty (F’08) received the B.Tech. degree from the Indian Institute of Technology Kharagpur, Kharagpur, India, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, MI, USA, in 1992 and 1995, respectively.
He is currently the William H. Younger Distinguished Professor of Engineering with the Department of Electrical and Computer Engineering and a Professor of Computer Science...Show More
Krishnendu Chakrabarty (F’08) received the B.Tech. degree from the Indian Institute of Technology Kharagpur, Kharagpur, India, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, MI, USA, in 1992 and 1995, respectively.
He is currently the William H. Younger Distinguished Professor of Engineering with the Department of Electrical and Computer Engineering and a Professor of Computer Science...View more
Karlsruhe Institute of Technology, Karlsruhe, Germany
Mehdi B. Tahoori (S’02–M’04–SM’08) received the B.S. degree in computer engineering from the Sharif University of Technology, Tehran, Iran, in 2000, and the M.S. and Ph.D. degrees in electrical engineering from Stanford University, Stanford, CA, USA, in 2002 and 2003, respectively.
He is currently a Full Professor and the Chair of Dependable Nano-Computing, Institute of Computer Science and Engineering, Department of Compu...Show More
Mehdi B. Tahoori (S’02–M’04–SM’08) received the B.S. degree in computer engineering from the Sharif University of Technology, Tehran, Iran, in 2000, and the M.S. and Ph.D. degrees in electrical engineering from Stanford University, Stanford, CA, USA, in 2002 and 2003, respectively.
He is currently a Full Professor and the Chair of Dependable Nano-Computing, Institute of Computer Science and Engineering, Department of Compu...View more
Contents Karlsruhe Institute of Technology, Karlsruhe, Germany
Arunkumar Vijayan received the bachelor’s degree from the Cochin University of Science and Technology, Kochi, India, in 2009, and the master’ degree in microelectronics and very large scale integration from the Indian Institute of Technology Bombay, Mumbai, India. He is currently pursuing the Ph.D. degree with the CDNC Group, Karlsruhe Institute of Technology, Karlsruhe, Germany, under the supervision of Prof. M. Tahoori.
In 2013, he joined LSI Corporation, Pune, India, and had been there for one year as a FPGA Prototyping Engineer in Flash Components Division. His current research interests include aging and soft-error aware resilient system design and machine learning.
Arunkumar Vijayan received the bachelor’s degree from the Cochin University of Science and Technology, Kochi, India, in 2009, and the master’ degree in microelectronics and very large scale integration from the Indian Institute of Technology Bombay, Mumbai, India. He is currently pursuing the Ph.D. degree with the CDNC Group, Karlsruhe Institute of Technology, Karlsruhe, Germany, under the supervision of Prof. M. Tahoori.
In 2013, he joined LSI Corporation, Pune, India, and had been there for one year as a FPGA Prototyping Engineer in Flash Components Division. His current research interests include aging and soft-error aware resilient system design and machine learning.View more
Duke University, Durham, NC, USA
Abhishek Koneru received the B.Tech. and M.Tech. degrees in electrical engineering from the Indian Institute of Technology Kanpur, Kanpur, India, in 2014. He is currently pursuing the Ph.D. degree in electrical and computer engineering from Duke University, Durham, NC, USA.
He was an Intern with Intel Corporation, Santa Clara, CA, USA, and TSMC Technology Inc., San Jose, CA, USA. His current research interests include testing and design-for-testability of monolithic 3-D integrated circuits and machine learning.
Mr. Koneru was a recipient of the scholarship from the Indian Central Board of Secondary Education.
Abhishek Koneru received the B.Tech. and M.Tech. degrees in electrical engineering from the Indian Institute of Technology Kanpur, Kanpur, India, in 2014. He is currently pursuing the Ph.D. degree in electrical and computer engineering from Duke University, Durham, NC, USA.
He was an Intern with Intel Corporation, Santa Clara, CA, USA, and TSMC Technology Inc., San Jose, CA, USA. His current research interests include testing and design-for-testability of monolithic 3-D integrated circuits and machine learning.
Mr. Koneru was a recipient of the scholarship from the Indian Central Board of Secondary Education.View more
Karlsruhe Institute of Technology, Karlsruhe, Germany
Saman Kiamehr received the B.Sc. degree in electrical engineering from Sharif University, Tehran, Iran, in 2006, the M.Sc. degree in electrical engineering from the University of Tehran, Tehran, Iran, in 2010, and the Ph.D. degree in computer science and engineering from the Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, in 2015.
Since 2015, he has been a Research Group Leader with the Chair of Dependable Nano Computing, KIT. His current research interests include low-power high-performance digital circuits and systems design and reliability-aware design and optimization techniques in the nanoscale era and near threshold computing.
Saman Kiamehr received the B.Sc. degree in electrical engineering from Sharif University, Tehran, Iran, in 2006, the M.Sc. degree in electrical engineering from the University of Tehran, Tehran, Iran, in 2010, and the Ph.D. degree in computer science and engineering from the Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, in 2015.
Since 2015, he has been a Research Group Leader with the Chair of Dependable Nano Computing, KIT. His current research interests include low-power high-performance digital circuits and systems design and reliability-aware design and optimization techniques in the nanoscale era and near threshold computing.View more
Duke University, Durham, NC, USA
Krishnendu Chakrabarty (F’08) received the B.Tech. degree from the Indian Institute of Technology Kharagpur, Kharagpur, India, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, MI, USA, in 1992 and 1995, respectively.
He is currently the William H. Younger Distinguished Professor of Engineering with the Department of Electrical and Computer Engineering and a Professor of Computer Science with Duke University, Durham, NC, USA, where he also serves as the Director of Graduate Studies for Electrical and Computer Engineering. He is a Research Ambassador with the University of Bremen, Bremen, Germany, and a Hans Fischer Senior Fellow (named after Nobel Laureate Prof. H. Fischer) with the Institute for Advanced Studies, Technical University of Munich, Munich, Germany. He has authored 18 books on these topics (with one translated into Chinese), published over 590 papers in journals and refereed conference proceedings, and given over 260 invited, keynote, and plenary talks. He has also presented 50 tutorials at major international conferences. He holds eight U.S. patents, with several patents pending. His current research interests include testing and design-for-testability of integrated circuits, digital microfluidics, biochips, and cyberphysical systems, optimization of enterprise systems and smart manufacturing.
Prof. Chakrabarty was a recipient of the National Science Foundation Early Faculty (CAREER) Award, the Office of Naval Research Young Investigator Award, the Humboldt Research Award from the Alexander von Humboldt Foundation, Germany, the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Donald O. Pederson Best Paper Award in 2015, the 11 Best Paper Awards at major IEEE conferences, the IEEE Computer Society Technical Achievement Award in 2015, the Distinguished Alumnus Award from the Indian Institute of Technology Kharagpur in 2014, the 2008 Duke University Graduate School Deans Award for excellence in mentoring, and the 2010 Capers and Marion McDonald Award for Excellence in Mentoring and Advising, Pratt School of Engineering, Duke University. He served as an Editor-in-Chief for IEEE Design & Test of Computers from 2010 to 2012 and the ACM Journal on Emerging Technologies in Computing Systems from 2010 to 2015. He currently serves as an Editor-in-Chief for the IEEE Transactions on Very Large Scale Integration (VLSI) Systems. He is also an Associate Editor of the IEEE Transactions on Computers, the IEEE Transactions on Biomedical Circuits and Systems, the IEEE Transactions on Multiscale Computing Systems, and the ACM Transactions on Design Automation of Electronic Systems. He serves as an Editor for the Journal of Electronic Testing: Theory and Applications. In the recent past, he has served as an Associate Editor for the IEEE Transactions on Very Large Scale Integration (VLSI) Systems from 2005 to 2009, the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems from 2001 to 2013, IEEE Transactions on Circuits and Systems—Part I: Regular Papers from 2005 to 2006, and the IEEE Transactions on Circuits and Systems—Part II: Express Briefs from 2010 to 2013. He was a 2009 Invitational Fellow of the Japan Society for the Promotion of Science. He has served as a Distinguished Visitor of the IEEE Computer Society from 2005 to 2007 and from 2010 to 2012, and as a Distinguished Lecturer of the IEEE Circuits and Systems Society from 2006 to 2007 and from 2012 to 2013. He currently serves as an ACM Distinguished Speaker. He is a fellow of ACM and a Golden Core Member of the IEEE Computer Society.
Krishnendu Chakrabarty (F’08) received the B.Tech. degree from the Indian Institute of Technology Kharagpur, Kharagpur, India, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, MI, USA, in 1992 and 1995, respectively.
He is currently the William H. Younger Distinguished Professor of Engineering with the Department of Electrical and Computer Engineering and a Professor of Computer Science with Duke University, Durham, NC, USA, where he also serves as the Director of Graduate Studies for Electrical and Computer Engineering. He is a Research Ambassador with the University of Bremen, Bremen, Germany, and a Hans Fischer Senior Fellow (named after Nobel Laureate Prof. H. Fischer) with the Institute for Advanced Studies, Technical University of Munich, Munich, Germany. He has authored 18 books on these topics (with one translated into Chinese), published over 590 papers in journals and refereed conference proceedings, and given over 260 invited, keynote, and plenary talks. He has also presented 50 tutorials at major international conferences. He holds eight U.S. patents, with several patents pending. His current research interests include testing and design-for-testability of integrated circuits, digital microfluidics, biochips, and cyberphysical systems, optimization of enterprise systems and smart manufacturing.
Prof. Chakrabarty was a recipient of the National Science Foundation Early Faculty (CAREER) Award, the Office of Naval Research Young Investigator Award, the Humboldt Research Award from the Alexander von Humboldt Foundation, Germany, the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Donald O. Pederson Best Paper Award in 2015, the 11 Best Paper Awards at major IEEE conferences, the IEEE Computer Society Technical Achievement Award in 2015, the Distinguished Alumnus Award from the Indian Institute of Technology Kharagpur in 2014, the 2008 Duke University Graduate School Deans Award for excellence in mentoring, and the 2010 Capers and Marion McDonald Award for Excellence in Mentoring and Advising, Pratt School of Engineering, Duke University. He served as an Editor-in-Chief for IEEE Design & Test of Computers from 2010 to 2012 and the ACM Journal on Emerging Technologies in Computing Systems from 2010 to 2015. He currently serves as an Editor-in-Chief for the IEEE Transactions on Very Large Scale Integration (VLSI) Systems. He is also an Associate Editor of the IEEE Transactions on Computers, the IEEE Transactions on Biomedical Circuits and Systems, the IEEE Transactions on Multiscale Computing Systems, and the ACM Transactions on Design Automation of Electronic Systems. He serves as an Editor for the Journal of Electronic Testing: Theory and Applications. In the recent past, he has served as an Associate Editor for the IEEE Transactions on Very Large Scale Integration (VLSI) Systems from 2005 to 2009, the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems from 2001 to 2013, IEEE Transactions on Circuits and Systems—Part I: Regular Papers from 2005 to 2006, and the IEEE Transactions on Circuits and Systems—Part II: Express Briefs from 2010 to 2013. He was a 2009 Invitational Fellow of the Japan Society for the Promotion of Science. He has served as a Distinguished Visitor of the IEEE Computer Society from 2005 to 2007 and from 2010 to 2012, and as a Distinguished Lecturer of the IEEE Circuits and Systems Society from 2006 to 2007 and from 2012 to 2013. He currently serves as an ACM Distinguished Speaker. He is a fellow of ACM and a Golden Core Member of the IEEE Computer Society.View more
Karlsruhe Institute of Technology, Karlsruhe, Germany
Mehdi B. Tahoori (S’02–M’04–SM’08) received the B.S. degree in computer engineering from the Sharif University of Technology, Tehran, Iran, in 2000, and the M.S. and Ph.D. degrees in electrical engineering from Stanford University, Stanford, CA, USA, in 2002 and 2003, respectively.
He is currently a Full Professor and the Chair of Dependable Nano-Computing, Institute of Computer Science and Engineering, Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany. In 2003, he was an Assistant Professor with the Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA, where he became an Associate Professor in 2009. In 2015, he was a Visiting Professor with Very Large Scale Integration (VLSI) Design and Education Center, University of Tokyo, Tokyo, Japan, for four months. From 2002 to 2003, he was a Research Scientist with Fujitsu Laboratories of America, Sunnyvale, CA, USA, in the area of advanced computer-aided research, engaged in reliability issues in deep-submicrometer mixed-signal VLSI designs. He holds five pending and granted U.S. and international patents. He has authored over 250 publications in major journals and conference proceedings on a wide range of topics, from dependable computing and emerging nanotechnologies to system biology. His current research interests include nanocomputing, reliable computing, VLSI testing, reconfigurable computing, emerging nanotechnologies, and systems biology.
Prof. Tahoori was a recipient of the National Science Foundation Early Faculty Development (CAREER) Award and a number of best paper nominations and awards at various conferences. He was a Program Committee Member as well as a Workshop, Panel, and Special Session Organizer of various conferences and symposia in the areas of VLSI testing, reliability, and emerging nanotechnologies, such as International Test Conference, VLSI Test Symposium, Design Automation Conference, International Conference on Computer-Aided Design, Design Automation and Test in Europe, European Test Symposium, International Conference on Computer Design, Asia and South Pacific Design Automation Conference, Great Lakes Symposium on VLSI, and VLSI Design. He is an Associate Editor of the ACM Journal of Emerging Technologies for Computing, the IEEE Design and Test Magazine, and the IET Computers and Digital Techniques and a Coordinating Editor of the Springer Journal of Electronic Testing. He is the Chair of the ACM SIGDA Technical Committee on test and reliability.
Mehdi B. Tahoori (S’02–M’04–SM’08) received the B.S. degree in computer engineering from the Sharif University of Technology, Tehran, Iran, in 2000, and the M.S. and Ph.D. degrees in electrical engineering from Stanford University, Stanford, CA, USA, in 2002 and 2003, respectively.
He is currently a Full Professor and the Chair of Dependable Nano-Computing, Institute of Computer Science and Engineering, Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany. In 2003, he was an Assistant Professor with the Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA, where he became an Associate Professor in 2009. In 2015, he was a Visiting Professor with Very Large Scale Integration (VLSI) Design and Education Center, University of Tokyo, Tokyo, Japan, for four months. From 2002 to 2003, he was a Research Scientist with Fujitsu Laboratories of America, Sunnyvale, CA, USA, in the area of advanced computer-aided research, engaged in reliability issues in deep-submicrometer mixed-signal VLSI designs. He holds five pending and granted U.S. and international patents. He has authored over 250 publications in major journals and conference proceedings on a wide range of topics, from dependable computing and emerging nanotechnologies to system biology. His current research interests include nanocomputing, reliable computing, VLSI testing, reconfigurable computing, emerging nanotechnologies, and systems biology.
Prof. Tahoori was a recipient of the National Science Foundation Early Faculty Development (CAREER) Award and a number of best paper nominations and awards at various conferences. He was a Program Committee Member as well as a Workshop, Panel, and Special Session Organizer of various conferences and symposia in the areas of VLSI testing, reliability, and emerging nanotechnologies, such as International Test Conference, VLSI Test Symposium, Design Automation Conference, International Conference on Computer-Aided Design, Design Automation and Test in Europe, European Test Symposium, International Conference on Computer Design, Asia and South Pacific Design Automation Conference, Great Lakes Symposium on VLSI, and VLSI Design. He is an Associate Editor of the ACM Journal of Emerging Technologies for Computing, the IEEE Design and Test Magazine, and the IET Computers and Digital Techniques and a Coordinating Editor of the Springer Journal of Electronic Testing. He is the Chair of the ACM SIGDA Technical Committee on test and reliability.View more
