Overlapping clustering of network data using cut metrics | IEEE Conference Publication | IEEE Xplore

Overlapping clustering of network data using cut metrics


Abstract:

We present a novel method to hierarchically cluster networked data allowing nodes to simultaneously belong to multiple clusters. Given a network, our method outputs a cut...Show More

Abstract:

We present a novel method to hierarchically cluster networked data allowing nodes to simultaneously belong to multiple clusters. Given a network, our method outputs a cut metric on the underlying node set, which can be related to data coverings at different resolutions. The cut metric is obtained by averaging a set of ultrametrics, which are themselves the output of (non-overlapping) hierarchically clustering noisy versions of the original network of interest. The resulting algorithm is illustrated in synthetic networks and is used to classify handwritten digits from the MNIST database.
Date of Conference: 20-25 March 2016
Date Added to IEEE Xplore: 19 May 2016
ISBN Information:
Electronic ISSN: 2379-190X
Conference Location: Shanghai, China

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