Loading [a11y]/accessibility-menu.js
Systematic comparison of metal contacts on CVD graphene | IEEE Conference Publication | IEEE Xplore
Scheduled Maintenance: On Tuesday, 8 April, IEEE Xplore will undergo scheduled maintenance from 1:00-5:00 PM ET (1800-2200 UTC). During this time, there may be intermittent impact on performance. We apologize for any inconvenience.

Systematic comparison of metal contacts on CVD graphene


Abstract:

An experimental study was conducted for forming high quality ohmic contacts to graphene. Metal contacts of platinum/gold (Pt/Au), nickel/gold (Ni/Au), palladium (Pd), Ni,...Show More

Abstract:

An experimental study was conducted for forming high quality ohmic contacts to graphene. Metal contacts of platinum/gold (Pt/Au), nickel/gold (Ni/Au), palladium (Pd), Ni, and Au to monolayer chemical vapor deposited graphene were studied. The experimental data reveal that pure Au and Ni/Au provide highly reproducible low resistance ohmic contacts. The results presented in this work indicate potential contact metals suitable for high frequency electronic devices.
Date of Conference: 14-18 September 2015
Date Added to IEEE Xplore: 12 November 2015
ISBN Information:

ISSN Information:

Conference Location: Graz, Austria
University of Siegen, School of Science and Technology, Siegen, Germany
University of Siegen, School of Science and Technology, Siegen, Germany
University of Siegen, School of Science and Technology, Siegen, Germany
University of Siegen, School of Science and Technology, Siegen, Germany
University of Siegen, School of Science and Technology, Siegen, Germany
University of Siegen, School of Science and Technology, Siegen, Germany

University of Siegen, School of Science and Technology, Siegen, Germany
University of Siegen, School of Science and Technology, Siegen, Germany
University of Siegen, School of Science and Technology, Siegen, Germany
University of Siegen, School of Science and Technology, Siegen, Germany
University of Siegen, School of Science and Technology, Siegen, Germany
University of Siegen, School of Science and Technology, Siegen, Germany

Contact IEEE to Subscribe

References

References is not available for this document.