Loading [MathJax]/extensions/MathZoom.js
Characterization of the optical properties of GaN:Fe for high voltage photoconductive switch applications | IEEE Conference Publication | IEEE Xplore

Characterization of the optical properties of GaN:Fe for high voltage photoconductive switch applications


Abstract:

The optical properties of bulk semi-insulating GaN:Fe are obtained to assess its future suitability as a high voltage photoconductive semiconductor switch (PCSS). The mat...Show More

Abstract:

The optical properties of bulk semi-insulating GaN:Fe are obtained to assess its future suitability as a high voltage photoconductive semiconductor switch (PCSS). The material properties of GaN:Fe hold significant promise to improve devices for pulsed power and other applications. Growth techniques of bulk GaN:Fe, which have hitherto been largely insufficient for commercial applications, are nearing the point that anticipatory characterization research is warranted. In this paper, the optical constants of bulk GaN:Fe (refractive index, absorption coefficient, and off-state dielectric function) were determined by optical reflection/transmission analysis. The results of this analysis are compared with a similar treatment of bulk 4H-SiC as well as possible elements of PCSS housing: Sylgard 184 elastomer, and EFI 20003/50013 electrical potting epoxy. The data presented provide foundational material characterization to enable assessment of the feasibility of GaN:Fe as a practical high voltage PCSS material. Beyond basic materials research, these properties inform design optimization in PCSS construction and implementation.
Date of Conference: 31 May 2015 - 04 June 2015
Date Added to IEEE Xplore: 15 October 2015
ISBN Information:

ISSN Information:

Conference Location: Austin, TX, USA

Contact IEEE to Subscribe

References

References is not available for this document.