Loading [MathJax]/extensions/MathZoom.js
Switching investigations on a SiC MOSFET in a TO-247 package | IEEE Conference Publication | IEEE Xplore

Switching investigations on a SiC MOSFET in a TO-247 package


Abstract:

This paper deals with the switching behavior of a SiC MOSFET in a TO-247 package. Based on simulations, critical parasitic inductances in the circuit layout are analyzed ...Show More

Abstract:

This paper deals with the switching behavior of a SiC MOSFET in a TO-247 package. Based on simulations, critical parasitic inductances in the circuit layout are analyzed and their effect on the switching losses highlighted. Especially the common source inductance, a critical parameter in a TO-247 package, has a major influence on the switching energy. Crucial design guidelines for an improved double pulse test circuit are introduced which are used for practical investigations on the switching behavior. Switching energies of a SiC MOSFET in a TO-247 package is measured depending on varying gate resistance and loop inductances. With total switching energy of 340.24 μJ, the SiC MOSFET has more than six times lower switching losses than a regular Si IGBT. Implementing the SiC switches in a 3kW T-Type inverter topology, efficiency improvements of 0.8 % are achieved and maximum efficiency of 97.7 % is reached.
Date of Conference: 29 October 2014 - 01 November 2014
Date Added to IEEE Xplore: 26 February 2015
Electronic ISBN:978-1-4799-4032-5
Print ISSN: 1553-572X
Conference Location: Dallas, TX, USA

Contact IEEE to Subscribe

References

References is not available for this document.